Home News High-Accuracy, 3D Vision Measuring Machine

High-Accuracy, 3D Vision Measuring Machine

Inspection/Testing Equipment, Industry News, IMTS, IMTS 2012

Mitutoyo's Quick Vision WLI eliminates the need to move a workpiece from one type of machine to another.

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Manufacturing Group October 12, 2012

Officials at Mitutoyo America Corporation announce the release of the new Quick Vision WLI vision measuring machine.  Besides an optical vision head, the Quick Vision WLI also incorporates a white light interferometer (WLI) head. Together these heads enable high accuracy performance of non-contact vision plus non-contact 3D measurement of high aspect-ratio minute form functions in a single machine, eliminating the need to move a workpiece from one type of machine to another.

As a result, the Quick Vision WLI offers a significant throughput improvement for non-contact measurement of items combining both 2D and minute form 3D features in a single workpiece – example subjects could include IC chips and packages, hybrid chassis, lead frames, and many types of precision machined and molded parts. 

The Quick Vision WLI interferometer head splits a beam of white light in two; one beam goes towards a reference mirror and the other beam goes to the workpiece.  As the reference objective is moved along the Z-axis, a white “interference ring” is observed on the focus point; analysis of this ring makes it possible to determine the 3D shape of the feature under observation.

The Quick Vision WLI performs 2D and 3D form evaluation using Mitutoyo FORMPAK-QV/FORMTRACEPAK-PRO software that features a refined, intuitive GUI.  Results can be displayed in 2D and 3D graphics for easy interpretation; a variety of editing and control tools are standard.

In addition, new Quick Vision WLI 2D/3D non-contact measuring machines can support output to measurement data applications such as MeasurLink, Mitutoyo’s proprietary statistical-processing and process-control program which performs statistical analysis and provides real-time display of measurement results for SPC applications.  The program can also be linked to a higher-level network environment for enterprise-wide functionality.
 

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